A frame consisting of a simple span BD, an overhang AB, and a bracket CEF, is supported by a pin at B and a roller at D (see Figure 2). The beam ABCD has a uniform cross section with a moment of inertia I = 0.00025 ft¼. The frame is subjected to a concentrated load P at point F as shown in the figure. Take E 32,000 ksi, L 12 ft, a = 6 ft, and P = 900 lb. = = a) Draw the shear force and bending moment diagrams of the horizontal section ABCD using the graphical method. (Hint: use the method of sections to study CEF first) b) Using the method of superposition, find an expression for the elastic curve v(x) of the segment BC. x is a horizontal coordinate measured from point of A. (Hint: select appropriate cases from the table shown below and use superposition to find v(x') for 0 ≤ L x' ≤½, then translate the origin of the coordinate system to point A to get the final expression 3' in terms of x). c) Using the method of integration, find expressions for the elastic curve v(x) of the segments AB and CD. x is a horizontal coordinate measure from point of A. d) Plot the elastic curve for the horizontal section ABCD using appropriate computer software. L L 2 3 A B C E F P 17 Figure 2 2L 3 D

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Multiple choice questions, please help thank you!! 1. The chemical potential (μ) of smaller size clusters is bigger than that of bigger size clusters because of  (a) their small size  (b) the fewer number of atoms in them (c) surface area is smaller (d) their surface is more curved 2. Which of these characteristics would you associate with SEM: A surface imaging tool Maintained under vacuum Provides imaging and compositional data Uses a scanned electron beam All of the above   3. Secondary electrons (SE) are best described as Low energy electrons from the sample surface  High energy electrons from the sample surface  Low energy primary beam electrons  High energy primary beam electrons 4. Atomic force microscopy (AFM) is the most widely used form of scanning probe microscopes for the characterization of nanomaterials since it require: (a) electrically conductive and optically transparent samples (b) neither electrically conductive nor optically transparent samples (c) electrically…