X-ray diffraction made in aluminum metal with FCC structure in the X-ray diffraction pattern obtained as a result of the measurements of aluminum at 78.3 ° (311) A peak belonging to the plane was determined. In the light of these data, the lattice parameter of aluminum calculate. (The wavelength of the X-ray source used is 0.15418 nm.)

X-ray diffraction made in aluminum metal with FCC structure in the X-ray diffraction pattern obtained as a result of the measurements of aluminum at 78.3 ° (311) A peak belonging to the plane was determined. In the light of these data, the lattice parameter of aluminum calculate. (The wavelength of the X-ray source used is 0.15418 nm.)