When an x-ray beam is scattered off the planes of a crystal, the scattered beam creates an interference pattern. This phenomenon is called Bragg scattering. For an observer to measure an interference maximum, two conditions have to be satisfied: 1. The angle of incidence has to be equal to the angle of reflection. 2. The difference in the beam's path from a source to an observer for neighboring planes has to be equal to an integer multiple of the wavelength; that is, 2d sin(0) = mx for m=1,2,.... The path difference 2d sin(0) can be determined from the diagram ( Figure 1). The second condition is known as the Bragg condition. ▾ ▼ Part A An x-ray beam with wavelength 0.250 nm is directed at a crystal. As the angle of incidence increases, you observe the first strong interference maximum at an angle 21.0°. What is the spacing d between the planes of the crystal? Express your answer in nanometers to four significant figures. VT| ΑΣΦ/ 3 d- 0.1339 M ? Submit Previous Answers Request Answer Part B X Incorrect; Try Again; 4 attempts remaining nm Find the angle 82 at which you will find a second maximum. Express your answer in degrees to three significant figures.

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Using X-ray Diffraction
When an x-ray beam is scattered off the planes of a crystal, the scattered
beam creates an interference pattern. This phenomenon is called Bragg
scattering. For an observer to measure an interference maximum, two
conditions have to be satisfied:
1. The angle of incidence has to be equal to the angle of
reflection.
2. The difference in the beam's path from a source to an
observer for neighboring planes has to be equal to an integer
multiple of the wavelength; that is,
2d sin(0) = mx
for m = 1, 2, ....
The path difference 2d sin(0) can be determined from the diagram (
Figure 1). The second condition is known as the Bragg condition.
Figure
d sine
d sine
1 of 1
Part A
—| ΑΣΦ
d= 0.1339
Submit Previous Answers Request Answer
An x-ray beam with wavelength 0.250 nm is directed at a crystal. As the angle of incidence increases, you observe the first strong interference maximum at an angle 21.0°. What
is the spacing d between the planes of the crystal?
Express your answer in nanometers to four significant figures.
X Incorrect; Try Again; 4 attempts remaining
Part B
0₂ =
Find the angle 02 at which you will find a second maximum.
Express your answer in degrees to three significant figures.
ΞΑΣΦ
Submit
?
Request Answer
Part C Complete previous part(s)
Provide Feedback
nm
?
12 of 23
O
Review | Constants
>
Next >
Transcribed Image Text:Using X-ray Diffraction When an x-ray beam is scattered off the planes of a crystal, the scattered beam creates an interference pattern. This phenomenon is called Bragg scattering. For an observer to measure an interference maximum, two conditions have to be satisfied: 1. The angle of incidence has to be equal to the angle of reflection. 2. The difference in the beam's path from a source to an observer for neighboring planes has to be equal to an integer multiple of the wavelength; that is, 2d sin(0) = mx for m = 1, 2, .... The path difference 2d sin(0) can be determined from the diagram ( Figure 1). The second condition is known as the Bragg condition. Figure d sine d sine 1 of 1 Part A —| ΑΣΦ d= 0.1339 Submit Previous Answers Request Answer An x-ray beam with wavelength 0.250 nm is directed at a crystal. As the angle of incidence increases, you observe the first strong interference maximum at an angle 21.0°. What is the spacing d between the planes of the crystal? Express your answer in nanometers to four significant figures. X Incorrect; Try Again; 4 attempts remaining Part B 0₂ = Find the angle 02 at which you will find a second maximum. Express your answer in degrees to three significant figures. ΞΑΣΦ Submit ? Request Answer Part C Complete previous part(s) Provide Feedback nm ? 12 of 23 O Review | Constants > Next >
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