MATLAB: An Introduction with Applications
MATLAB: An Introduction with Applications
6th Edition
ISBN: 9781119256830
Author: Amos Gilat
Publisher: John Wiley & Sons Inc
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The article “Limited Yield Estimation for Visual Defect Sources” (IEEE Trans. on Semiconductor Manuf., 1997: 17–23) reported that, in a study of a particular wafer inspection process, 356 dies were examined by an inspection probe and 201 of these passed the probe.

a) Assuming a stable process, calculate a 95% (two-sided) confidence interval for the proportion of all dies that pass the probe.

b) perform the corresponding two-tailed hypothesis test

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