(i) Draw a scatter diagram between height and FEV. (ii) Find the best-fitting regression line, and test it for statistical significance using F-test and t test. (iii) Find coefficient of correlation and coefficient of determination.

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please could you solve the questions  are highlighted with yellow color. please show all work.

2+2? how

Transversals and Angle Measurements P Use the diagram to find all of the missing angles, knowing that a || b Z1 = 42 = 23 = 1= 3 2 54° 12 11 67° 10 7 8 9 4 6 5 a ➜b

True or False and explain why

In the construction process for solid-state flash memory drives (thumb drives), nearly all drives areconstructed with a large potential amount of storage space, and are sold base on the actual amountof memory that forms correctly during the process (For example, drives that are designed to store 64gb but contain a large number of bad sectors will instead be formated and sold as 32 gb). Consider amanufacturing process where every chip has a 21% of having enough bad sectors to be downgraded,and these errors are random and independent. (a) If we wish to compute the probability that x number of chips out of a production run of size n are downgraded, do we have a probability distribution that will work for that? Are the assumptionsfor that met? Explain. (b) Compute the probability that between 3 and 5 (inclusive)or between 2 and 8 (inclusive) are downgraded. (c) Graph the probability mass function for x number of chips out of a production run of 10 aredowngraded.

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solve all

6cose+3=0