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HW1 : If an X - ray diffraction pattern for a powder sample of Cr ( crystal system : body - centered cubic and lattice parameter a = 0.2000 nm) is measured using a conventional diffractometer , we will obtain six diffraction peaks corresponding to ( 110 ), ( 200),( 211), ( 220), (310), and ( 222 ) planes . Compute the Lorentz - polarization factor using Cu - K, radiation Lamda = 1.545 nm. Hint : make a table for indexing pattern analysis . e 5:44

HW1 : If an X - ray diffraction pattern for a powder sample of Cr ( crystal system : body - centered cubic and lattice parameter a = 0.2000 nm) is measured using a conventional diffractometer , we will obtain six diffraction peaks corresponding to ( 110 ), ( 200),( 211), ( 220), (310), and ( 222 ) planes . Compute the Lorentz - polarization factor using Cu - K, radiation Lamda = 1.545 nm. Hint : make a table for indexing pattern analysis . e 5:44

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HW1 : If an X - ray diffraction pattern for a powder sample of Cr ( crystal system : body - centered cubic and lattice parameter a = 0.2000 nm) is measured using a conventional diffractometer , we will obtain six diffraction peaks corresponding to (110),( 200),(211),(220), ( 310), and ( 222) planes . Compute the Lorentz - polarization factor using Cu - K, radiation Lamda = 1.545 nm . Hint : make a table for indexing pattern analysis . e 5:44 /
Transcribed Image Text:HW1 : If an X - ray diffraction pattern for a powder sample of Cr ( crystal system : body - centered cubic and lattice parameter a = 0.2000 nm) is measured using a conventional diffractometer , we will obtain six diffraction peaks corresponding to (110),( 200),(211),(220), ( 310), and ( 222) planes . Compute the Lorentz - polarization factor using Cu - K, radiation Lamda = 1.545 nm . Hint : make a table for indexing pattern analysis . e 5:44 /
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