How can I find D and B. D (1) B cos 0 Note: D is the crystallite size (nm), k is a constant (0.94), (Cu-Ka = 0.1541 nm), 20=31.77°, Diffraction line (100), çell constants a=b=3.25Å

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The full width at half of Imax of AB2 powder is 0.2° at 20=32°. Please calculate the crystal size of the sample. Can particle size be determined by XRD analysis? Briefly explain the difference between particle and crystal size

Q₁ find JUD & C for beams 25kN/m 130KN +1.25 5 * B D 2.5 * 2.5 + EXI-Constant

QUESTION 2. Identify whether the following statements are TRUE or FALSE. No explanation is needed. 1. Larger numerical aperture (NA) improves depth of focus (DOF). True OR False 2. Double Processing (DP) improves resolution for projection lithography. True OR False 3. Gate oxide isolates different MOS transistors on the same substrate. True OR False 4. Drain and Source of a MOS transistor is made from polysilicon. True OR False 5. In proximity printing/lithography resolution is not good because the gap True OR False between the mask and the resist causes strong light diffraction. 6. Higher contrast leads to higher resolution in a photoresist. True OR False 7. Phase shifting masks (PSM) enhances resolution in lithography. True OR False 8. Resists which require lower dose for full exposure have higher sensitivity. True OR False 9. Damascus blades contained carbon nanotubes. True OR False 10. Standing wave formation in photoresist leads to better photoresist profiles. True OR False

HW1: If an X-ray diffraction pattern for a powder sample of Cr (crystal system: body-centered cubic and lattice parameter a=0.2000 nm) is measured using a conventional diffractometer, we will obtain six diffraction peaks corresponding to (110), (200), (211), (220), (310), and (222) planes. Compute the Lorentz-polarization factor using Cu-K̟radiation Lamda=1.545 nm. Hint: make a table for indexing pattern analysis.

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