For an x-radiographic inspection of the plate in Figure 1 using a 100-keV beam. Calculate the change in 1/1, between the flawed and flaw-free areas given that the effect of the flaw is to reduce the effective thickness of the plate by 10 µm. Assume the sample is aluminium with a flaw depth at 10 mm and overall sample thickness of 20 mm. Comment on the relative advantages of ultrasonic testing for the inspection of the flaw in that sample.

Elements Of Electromagnetics
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ISBN:9780190698614
Author:Sadiku, Matthew N. O.
Publisher:Sadiku, Matthew N. O.
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For an x-radiographic inspection of the plate in Figure 1 using a 100-keV beam. Calculate the change
in I/I, between the flawed and flaw-free areas given that the effect of the flaw is to reduce the effective
thickness of the plate by 10 µm. Assume the sample is aluminium with a flaw depth at 10 mm and
overall sample thickness of 20 mm. Comment on the relative advantages of ultrasonic testing for the
inspection of the flaw in that sample.
Initial pulse
Front
surface
Oscilloscope
display
Back
Flaw surface
Time
Ultrasonic transducer
Water
bath
Flaw
Sample
Transcribed Image Text:For an x-radiographic inspection of the plate in Figure 1 using a 100-keV beam. Calculate the change in I/I, between the flawed and flaw-free areas given that the effect of the flaw is to reduce the effective thickness of the plate by 10 µm. Assume the sample is aluminium with a flaw depth at 10 mm and overall sample thickness of 20 mm. Comment on the relative advantages of ultrasonic testing for the inspection of the flaw in that sample. Initial pulse Front surface Oscilloscope display Back Flaw surface Time Ultrasonic transducer Water bath Flaw Sample
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