V. DATA AND TABULATION 1. Depending upon the form of the specifications for use of the material under test, the report shall include the following: 1.1. Total percentage of material passing each sieve, or 1.2. Total percentage of material retained oneach sieve, or 1.3. Percentage ofmaterial retained between consecutive sieves. 2. Report percentages to the nearest wholenumber, except if the percentage passing the 75-um (No. 200) sieveis less than 10 %, it shall be reported to the nearest 0.1%. 3. Report the fineness modulus, when required, to the nearest 0.01. CUMULATIVE CUMULATIVE SIEV AMOUNT AMOUNT PERCENT PERCENT RETAINED, g (b) RETAINED, 9 (a) RETAINED, (c)=(b)*100/TÓT E PASSING SIZ (d)=100 - (c) AL 1% 215 885 3/4 980 1/2 2350 3/8 1190 4. 2205 1985 10 1840 40 1650 100 980 200 660 PAN 60 15000 ТОTAL [7]

Structural Analysis
6th Edition
ISBN:9781337630931
Author:KASSIMALI, Aslam.
Publisher:KASSIMALI, Aslam.
Chapter2: Loads On Structures
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V.
DATA AND TABULATION
1. Depending upon the form of the specifications for use of the material under test, the
report shall include the following:
1.1. Total percentage of material passing each sieve, or
1.2. Total percentage of material retained oneach sieve,
or
1.3. Percentage ofmaterial retained between consecutive sieves.
2. Report percentages to the nearest wholenumber, except if the percentage passing the
75-um (No. 200) sieveis less than 10 %, it shall be reported to the nearest 0.1%.
3. Report the fineness modulus, when required, to the nearest 0.01.
CUMULATIVE
CUMULATIVE
SIEV
AMOUNT
AMOUNT
PERCENT
PERCENT
RETAINED, g (b)
RETAINED, 9
(a)
RETAINED,
(c)=(b)*100/TÓT
E
PASSING
SIZ
(d)=100 - (c)
AL
1%
215
885
3/4
980
1/2
2350
3/8
1190
4.
2205
1985
10
1840
40
1650
100
980
200
660
PAN
60
15000
ТОTAL
[7]
Transcribed Image Text:V. DATA AND TABULATION 1. Depending upon the form of the specifications for use of the material under test, the report shall include the following: 1.1. Total percentage of material passing each sieve, or 1.2. Total percentage of material retained oneach sieve, or 1.3. Percentage ofmaterial retained between consecutive sieves. 2. Report percentages to the nearest wholenumber, except if the percentage passing the 75-um (No. 200) sieveis less than 10 %, it shall be reported to the nearest 0.1%. 3. Report the fineness modulus, when required, to the nearest 0.01. CUMULATIVE CUMULATIVE SIEV AMOUNT AMOUNT PERCENT PERCENT RETAINED, g (b) RETAINED, 9 (a) RETAINED, (c)=(b)*100/TÓT E PASSING SIZ (d)=100 - (c) AL 1% 215 885 3/4 980 1/2 2350 3/8 1190 4. 2205 1985 10 1840 40 1650 100 980 200 660 PAN 60 15000 ТОTAL [7]
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