(c) (d) discuss the test result data and possible faults if it fails this test. comment on what manufacturers could do to implement quality management systems, aiming to reduce failure rate and improve testability of electronic products. marks) The TAP Controller state diagram is supplied in Figure 2. The current state is unknown. тск о TMS O D E A O с IC1 F B A G H TDI TDO TMS TCK W X Figure 1 Circuit diagram The instruction code set for IC1 is shown in the table below. Instruction OPCODE MSB LSB SAMPLE 1 0 1 INTEST 0 1 0 BYPASS 1 1 1 EXTEST 0 1 1 0 TLreset 0 Run-Test/Idle Y 1 Select DR 0 1 Select IR 0 Capture DR Capture IR 0 0 Shift DR Shift IR 0 0 Exit-1 DR 1 Exit-1 IR 1 0 0 Pause DR Pause IR 1 0 0 0 Exit-2 DR Exit-2 IR Update DR 1 0 Update IR 0 Figure 2 State diagram of the TAP controller Further information IC1 is an IEEE1149.1 compatible 8-port boundary scan device, where ports A to D are inputs and ports E to H are the corresponding outputs. A to H serially follow a path starting at TDI and finishing at TDO. The test procedure should show: the Clock Cycle, TDI, TMS, TDO, the Current State, the Next State and the current Instruction. Assume IC1 has an identity register but does not have external reset capability (e.g. no TRST). (c) (d) discuss the test result data and possible faults if it fails this test. comment on what manufacturers could do to implement quality management systems, aiming to reduce failure rate and improve testability of electronic products. marks) The TAP Controller state diagram is supplied in Figure 2. The current state is unknown. тск о TMS O D E A O с IC1 F B A G H TDI TDO TMS TCK W X Figure 1 Circuit diagram The instruction code set for IC1 is shown in the table below. Instruction OPCODE MSB LSB SAMPLE 1 0 1 INTEST 0 1 0 BYPASS 1 1 1 EXTEST 0 1 1 0 TLreset 0 Run-Test/Idle Y 1 Select DR 0 1 Select IR 0 Capture DR Capture IR 0 0 Shift DR Shift IR 0 0 Exit-1 DR 1 Exit-1 IR 1 0 0 Pause DR Pause IR 1 0 0 0 Exit-2 DR Exit-2 IR Update DR 1 0 Update IR 0 Figure 2 State diagram of the TAP controller Further information IC1 is an IEEE1149.1 compatible 8-port boundary scan device, where ports A to D are inputs and ports E to H are the corresponding outputs. A to H serially follow a path starting at TDI and finishing at TDO. The test procedure should show: the Clock Cycle, TDI, TMS, TDO, the Current State, the Next State and the current Instruction. Assume IC1 has an identity register but does not have external reset capability (e.g. no TRST).

Given the following Combinational circuit, Use Verilog HDL on Quartus tool to1. Write a Verilog HDL code to describe the module DCDR2×4 // this module name must be your last name ( younis2. Write a Verilog HDL code to describe the whole system structurally from its subsystems// this module name must be your university number ( 1181230)

Category: CPU Wiring Look at the following (incomplete) diagram of the Hack CPU taken from figure 5.9 of the textbook. ALU output outM instruction AM inM writeM A addressM inc reset PC po Match the wires A, B, C, D and E with the logic expression that describes the signal they should carry. The logic expressions use the operators not (!), and (&&) and or (I). The 16 wire instruction is named instr. The A and C instruction formats are: A-instruction: 0 V. V. V C-instruction: 1 1 1 a c1 c2 c3 c5 c6 d1 d2 d3 j1 j2 j3 Mire number: 15 14 13 12 11 10 9 8 6. 4 3 1 instr[15) && instr[3] B. instr[14] ALU

Describe the SBB instruction.

Can you answer it with diagram. please and thanks

[1] Show the block diagram of the hardware that implements the following register transfer statement: x+ yz: AR AR + BR

Describe the operation of a count-down timer in a system on chip (SoC) with a) an appropriate diagram illustration and explain how this timer chip can be used to measure time intervals. (b) If an interrupt is generated at 19199 Hz and the bus clock frequency is 24 MHz, what is the max value of the counter?

Provide the complete Signal Sequence Table for the Marie STOREI instruction (example slide provided)   Please do not use AI

Describe the differences between PROM and EEPROM memory products and state the type of applications for which each is best suited, including the underlying physical reasons why each product is best suited to a particular task. Q7 (a) (b) Figure Q7 shows a design for a 16×1bit SRAM module. i) Explain why this is a poor design and sketch the structure of a more practical design for this RAM module. ii) How many gates are saved in the decoder circuitry by your enhanced design, and how many gates would be saved if the module were a IMx1bit SRAM? iii) What are the disadvantages of your design approach? A IMx4bit DRAM module (of optimal internal design) requires each cell to be refreshed every 64 ms. Refresh for one row takes 60 ns. What fraction of the operating time of the device is lost in refreshing the memory cells? (c) Datain IN OUT SEL d WR 1 АЗ A2 IN OUTH SEL d WR A1 A0 - 2- IN OUTH SEL q WR 15 OUT SEL q WR IN R/W CS Dataout Figure Q7

Describe the differences between PROM and EEPROM memory products and state the type of applications for which each is best suited, including the underlying physical reasons why each product is best suited to a particular task. Q7 (a) (b) Figure Q7 shows a design for a 16x1bit SRAM module. i) Explain why this is a poor design and sketch the structure of a more practical design for this RAM module. ii) How many gates are saved in the decoder circuitry by your enhanced design, and how many gates would be saved if the module were a 1Mx1bit SRAM? iii) What are the disadvantages of your design approach? A IMx4bit DRAM module (of optimal internal design) requires each cell to be refreshed every 64 ms. Refresh for one row takes 60 ns. What fraction of the operating time of the device is lost in refreshing the memory cells? (c) Datain IN OUT SEL WR 1 IN OUT АЗ A2 A1 A0 - 2 SEL -q WR IN OUTH SEL WR OUTH SEL d WR IN R/W CS Dataout Figure Q7