An article reported that, in a study of a particular wafer inspection process, 356 dies were examined by an inspection stable process, calculate a 95% (two-sided) confidence interval for the proportion of all dies that pass the probe. x, X You may need to use the appropriate table in the Appendix of Tables to answer this question. probe (Round and 196 of these passed to three decimal your answers the probe. Assuming a places.)

A First Course in Probability (10th Edition)
10th Edition
ISBN:9780134753119
Author:Sheldon Ross
Publisher:Sheldon Ross
Chapter1: Combinatorial Analysis
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An article reported that, in a study of a particular wafer inspection process, 356 dies were examined
stable process, calculate a 95% (two-sided) confidence interval for the proportion of all dies that pass
X,
X
You may need to use the appropriate table in the Appendix of Tables to answer this question.
by
an inspection
the probe.
probe
(Round
and 196 of these
passed
to three decimal
your answers
the probe. Assuming a
places.)
Transcribed Image Text:An article reported that, in a study of a particular wafer inspection process, 356 dies were examined stable process, calculate a 95% (two-sided) confidence interval for the proportion of all dies that pass X, X You may need to use the appropriate table in the Appendix of Tables to answer this question. by an inspection the probe. probe (Round and 196 of these passed to three decimal your answers the probe. Assuming a places.)
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