6.6. A bin of 5 transistors is known to contain 2 that are defective. The transistors are to be tested, one at a time, until the defective ones are identified. Denote by N₁ the number of tests made until the first defective is identified and by N₂ the number of additional tests until the second defective is identi- fied. Find the joint probability mass function of N₁ and N₂.

6.6. A bin of 5 transistors is known to contain 2 that are defective. The transistors are to be tested, one at a time, until the defective ones are identified. Denote by N₁ the number of tests made until the first defective is identified and by N₂ the number of additional tests until the second defective is identi- fied. Find the joint probability mass function of N₁ and N₂.

Algebra & Trigonometry with Analytic Geometry

13th Edition

ISBN:9781133382119

Author:Swokowski

Publisher:Swokowski

Chapter10: Sequences, Series, And Probability

Section10.8: Probability

Problem 31E

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