if light travels from air (n=1), to a thin film of material M1 (n=1.45) on top of material M2 (n=1.72), determine the smallest thickness (in nm) of material M1 to observe constructive interference for the reflection of light of wavelength 549 nm 33 378 189 89 O 402

if light travels from air (n=1), to a thin film of material M1 (n=1.45) on top of material M2 (n=1.72), determine the smallest thickness (in nm) of material M1 to observe constructive interference for the reflection of light of wavelength 549 nm 33 378 189 89 O 402

University Physics Volume 3

17th Edition

ISBN:9781938168185

Author:William Moebs, Jeff Sanny

Publisher:William Moebs, Jeff Sanny

Chapter4: Diffraction

Section: Chapter Questions

Problem 76P: On a certain crystal, a first-order X-ray diffraction maximum is observed at an angle of 27.1°...

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Concept explainers

Interference of Light

The word "constructive" signifies addition in interference. Constructive interference occurs when the path of the waves that start from the slit differs by 1 entire wavelength or in the intervals of the same. Hence, the waves that are presented on the screen are in phase (crest to crest/trough to trough). The waves interfering constructively forms bright fringes on the screen.

Question

if light travels from air (n=1), to a thin film of material M1 (n=1.45) on top of material M2
(n=1.72), determine the smallest thickness (in nm) of material M1 to observe constructive
interference for the reflection of light of wavelength 549 nm
33
378
189
89
402

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